โซลูชั่นการเชื่อม SMT

มอบโซลูชั่นแบบครบวงจรสำหรับปัญหากระบวนการบัดกรี SMT เสนอวัสดุบัดกรีฟรี เช่น ครีมบัดกรี ลวดบัดกรี และแท่งบัดกรี แบ่งปันความรู้เกี่ยวกับกระบวนการบัดกรี SMT ติดตามเราได้ที่ JiaJinYuan เพื่อเรียนรู้ข้อมูลที่เกี่ยวข้องเพิ่มเติม

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Solder Samples from Electronics Factories Put Into Testing to Quickly Evaluate Production Line Compatibility

Solder Samples from Electronics Factories Put Into Testing to Quickly Evaluate Production Line Compatibility

For Solder Samples from electronics factories, putting them into production is not a mere formality; instead, the production line is used as a testing bench. JiajinYuan solder is directly loaded into the mass-production Solder Paste printer, and 50 samples are run using the same stencil, the same conveyor track, and the same reflow oven. During the process, close attention is paid to whether the squeegee pressure fluctuation range exceeds ±0.2 kg, whether the solder paste refill time is longer than 3 seconds, whether the chip displacement rate after placement is higher than 0.8%, and whether the AOI missed detection rate after reflow exceeds 0.15%. All these data come from real-time equipment logs and original AOI reports, rather than relying on laboratory simulation parameters.

Stencil Apertures and Solder Rheology Must Be Closely Matched

When we observed edge drawing on JiajinYuan solder on a 0.12 mm-thick laser-cut stencil, we did not immediately replace the stencil. Instead, we first fine-tuned the squeegee angle from 60° to 62°, and simultaneously reduced the release speed from 25 mm/s to 22 mm/s. This is because changes in solder viscosity directly affect the shear stress distribution at the moment of release. If the sidewall roughness of the stencil aperture exceeds 0.8 μm, even qualified solder can induce solder bridging. Therefore, for each sample test, a coordinate measuring machine must be used to re-measure the aperture dimensions and sidewall Ra values at at least 3 positions.

Placement Accuracy Is Inversely Constrained by Solder Slump

When the pre-reflow slump of JiajinYuan solder on 0402 component pads reaches 18 μm, the confidence of the placement machine's vision system in recognizing the solder paste contour drops by 12%, causing the nozzle downward pressure depth compensation to fail, which in turn leads to 0.3 mm-level misalignment. At this point, the SPI solder paste volume judgment threshold must be adjusted synchronously, and the placement pressure must be reduced from 45 N to 38 N. Otherwise, the tombstoning rate during subsequent reflow will jump from 0.02% to 0.27%, and this correlation must be locked in during the sample testing phase.

Reflow Profile Inflection Points Must Match the Solder Activation Window

The main activation peak of the Flux in JiajinYuan solder is concentrated in the 152℃~168℃ range. If the actual temperature bandwidth in the reflow oven's soaking zone exceeds ±1.5℃, or the heating slope between 145℃ and 155℃ is lower than 1.8℃/s, the residual oxide film on the OSP board surface cannot be fully removed, causing the void rate at the bottom of BGA packages to soar from 8% to 23%. Therefore, during sample testing, a thermal profiler board must be used to measure the actual temperature curve at the exit of each temperature zone, and a pixel-level comparison must be made with the recommended window in the solder technical manual.

Data Closed-Loop Determines the Success or Failure of Sample Testing

Within 48 hours after the sample test is completed, the SPI solder paste volume CV value, the placement machine's mean θ-angle offset, the number of AOI false bridging alarms, and the X-RAY solder joint wetting angle standard deviation must all be imported into the same Excel sheet. Conditional formatting is used to mark out-of-tolerance items, and then reverse analysis is performed to determine whether the problem is caused by the solder batch, stencil wear, or reflow oven thermocouple drift. Any data that appears normal when viewed individually may, when combined, serve as conclusive evidence of production line adaptation failure.

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